The XDA-205 silicon-based MEMS accelerometer adopts a compact CLCC-14 ceramic package and advanced MEMS sensing technology. This industrial grade dual-axis accelerometer features high stability, low noise, low temperature drift, excellent long-term stability, and reliable digital output performance for demanding industrial applications.
Part No, :
XDA-205Order(MOQ) :
1Product Series and Parameters
| Parameter | Test Conditions | Min | Typ | Max | Unit |
| Measurement range | User selectable | ±2, | g | ||
| ±3 | |||||
| -3 dB Bandwidth | 1000 | Hz | |||
| Nonlinearity | 0.1 | % FS | |||
| Cross Axis Sensitivity | 1 | % | |||
| Sensitivity | ±2 g | 256,000 | LSB/g | ||
| ±3 g | 168,000 | ||||
| Sensitivity Change due to Temperature | 1σ, over -40 ~ 85 °C | ±0.01 | %/°C | ||
| Sensitivity Repeatability | 1σ, @25 °C | 0.16 | % | ||
| 0 g Offset Output | −10 | ±5 | 10 | mg | |
| 0 g Offset vs. Temperature | −40°C ~ +85°C | −0.08 | ±0.02 | 0.08 | mg/°C |
| Vibration Rectification Error(VRE) | ±2g range, in a 1g orientation, offset due to 2.5g rms vibration |
<0.4 | g | ||
| Noise Spectral Density | 20 | ug/√Hz | |||
| Velocity Random Walk | X-axis and y-axis | 7.5 | mm/s/√Hr | ||
| Self Test Output Change | 0.8 | 1 | g | ||
| Output Data Rate | Fsysclk/32 | kHz | |||
| Output Resolution | 20 | Bits | |||
| Turn-on Time | Standby to measurement mode | < 10 | ms | ||
| Current consumption | Measurement mode Standy mode |
450 | uA | ||
| 20 | |||||
| Temperature Sensor Output at 25°C (T25) Scale Factor (TSF) |
4959.2 134.66 |
LSB LSB/°C |
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